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英文名称 |
中文名称 |
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Sieving |
筛分法 |
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Optical microscopy |
光学显微镜法 |
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Scanning electron microscopy |
扫描电镜法 |
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Transmission electron microscopy (TEM) |
透射电镜法 |
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Scanning TEM (STEM) |
扫描透射电镜法 |
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Scanning tunneling microscopy (STM) |
扫描隧道显微镜 |
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Scanning force microscopy (SFM) |
扫描力显微镜 |
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Gravitaional sedimentation |
重力沉降法 |
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Resistive pulsed |
电阻法 |
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Light obscuration |
光透法 |
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Fraunhofer diffraction |
夫琅和费衍射法 |
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Cetrifugal sedimentation |
离心沉降法 |
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Photon correlation spectroscopy(PCS) |
光子相关光谱分析法 |
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Hydrodynamic chromatography(HCD) |
流动色层分析法 |
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Field flow fractionation(FFF) |
场流分离法 |
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BET method |
BET法 |
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Small angle X-ray scatiering(XSAS) |
X-射线小角度散射法 |
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Chemisorption |
化学吸附法 |
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Adsorption-Titration method |
吸附-滴定法 |
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Mercury porosimetry |
压汞法 |
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Incipient wetness |
初湿含浸法 |
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Permeametry |
渗透测粒法 |
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Counterdiffusion |
反扩散法 |
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Small angle neutron scatiering(NSAS) |
中子小角散射法 |
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Volumetric adsorption |
体积吸附法 |
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Gravimetric adsorption |
重量吸附法 |
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Dynamic adsorption |
动态吸附法 |
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Calorimetry |
量热法 |
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IR-spectroscopy |
红外光谱法 |
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Raman spectroscopy |
拉曼光谱法 |
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UV-Vis spectroscopy |
紫外-可见光光谱法 |
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Mass spectrometry |
质谱 |
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Atomic absorption spectroscopy（AAS） |
原子吸收光谱 |
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Auger electron spectroscopy (AES) |
俄歇电子能谱 |
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Electron spectroscopy for chemical analysis (ESCA) |
化学分析电子能谱 |
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X-ray photoelectron spectroscopy（XPS） |
X射线电子能谱 |
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Uv-photoelectron spectroscopy（UPS） |
紫外光电子能谱 |
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Energy dispersive spectroscopy (EDS) |
能量色散谱 |
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Wavelength dispersive spectroscopy (WDS) |
波长分散谱 |
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Mossbauer spectroscopy |
穆斯堡尔谱 |
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Electron spin resonance (ESR) |
电子自旋共振 |
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Electron Paramagnetic Resonance(EPR) |
电子顺磁共振 |
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Nuclear magnetic resonance (NMR) |
核磁共振 |
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Thermal gravimetric analysis (TGA) |
热重分析 |
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Differential thermal analysis (DTA) |
差热分析 |
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Differential scanning calorimetry (DSC) |
差示扫描量热计法 |
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Thermomechanical analysis (TMA) |
热机械分析 |
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Temperature programmed desorption(TPD) |
程序升温脱附 |
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Temperature programmed oxidation(TPO) |
程序升温氧化 |
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Temperature programmed reduction(TPR) |
程序升温还原 |
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Temperature programmed surface reaction(TPSR) |
程序升温表面反应 |
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X-ray diffraction (XRD) |
X射线衍射 |
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Extended x-ray absorption fine structure (EXAFS) |
扩展X射线吸收精细结构 |
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Near-edge x-ray adsorption fine structure (NEXAFS) |
近边X射线吸收精细结构 |
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Surface extended x-ray adsorption fine structure (SEXAFS) |
表面扩展X射线吸收精细结构 |
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Electron energy loss spectroscopy (EELS) |
电子能量损失谱 |
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Low-energy electron diffraction (LEED) |
低能电子衍射 |
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Reflection high-energy electron diffraction (RHEED) |
反射高能电子衍射 |
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Magnetic force microscopy (MFM) |
磁力显微镜 |
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Secondary ion mass spectroscopy (SIMS) |
二次离子质谱 |
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Surface enhanced raman spectroscopy (SERS) |
表面增强拉曼光谱 |
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Elemental Analysis |
元素分析 |
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Electron probe microanalysis (EPMA) |
电子探针微分析 |
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Flame photometry |
火焰光度法 |
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X-ray fluorescence（XRF） |
X射线荧光 |
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Inductively Coupled Plasma-Mass Spectrometer (ICP-AES) |
电感耦合等离子体发射光谱 |
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Electron diffraction |
电子衍射 |
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Neutron diffraction |
中子衍射 |
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Optical rotatory dispersion (ORD) |
旋光色散 |
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Rutherford back scattering (RBS) |
卢瑟福背散射 |
